光伏阵列 I-V特性曲线测量误差分析与修正方法

作者:Yang Zhenyu; Su Jianhui; Wang Haining*; Zhang Jian
来源:Acta Energiae Solaris Sinica, 2023, 44(5): 210-216.
DOI:10.19912/j.0254-0096.tynxb.2022-0059

摘要

The on-site I-V measurement of photovoltaic array in a photovoltaic power station can evaluate the current system power generation performance and array status,but the on-site transmission line impedance will cause error in I-V measurement,which not only affects the accuracy of the estimate but also is not beneficial to the policy-making of the photovoltaic power station operation. The article analyzes the influence mechanism of measurement line impedance and environmental parameters on the conventional dynamic capacitance I-V measurement method,and conducts simulation verification. According to the influence mechanism of the error and the equivalent model of the measurement loop,the article proposes a method for measuring the I-V characteristics of a dual-capacitor combination,and develops a prototype for experimental verification. The experimental results indicate that the measurement method can efficaciously eliminate the influence on I- V measurement of photovoltaic array by line distribution parameters and improve the measurement accuracy. ? 2023 Science Press.

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