摘要

PANI nanodots array was fabricated in AAO template with potentiostatic method in a short time.The topographic image of PANI nanodots array was characterized by scanning electron microscopy(SEM) and atomic force microscopy(AFM).The I-V characteristics of conducting PANI nanodots array was measured wi...

  • 单位
    厦门大学; 固体表面物理化学国家重点实验室