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摘要
For visual measurement at high temperature, it is challenging to reduce the radiation emitted by high-temperature components and the influence of hot gas flow on image quality, which has a significant impact in fields such as aerospace or automotive manufacturing. Owing to the complicated optical imaging environment at high temperature, in this paper, a new method of image acquisition for high-temperature components based on Fourier single-pixel imaging is proposed, and a single pixel imaging system for high-temperature components is established. First, the working principle and reconstruction algorithm of Fourier single-pixel imaging are analyzed. Then, according to the thermal radiation characteristics of the high-temperature object, the influence of the object on the single-pixel imaging and the imaging spectral range are analyzed. Finally, a verification experiment is carried out for single-pixel imaging in a high-temperature environment. Experimental results indicate that only 30% of the sampled data can be used to image the target at high temperature, and the strong interference of the radiated light of the object itself is ignored. The experimental results show that the image features obtained by the proposed method are clearer than those obtained via traditional CCD/CMOS imaging and edge detection. This study provides a potential development direction for the application of single-pixel imaging in the industrial field of high-temperature components. ? 2021, Science Press. All right reserved.
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