曲线拟合法用于SF6分解组分的重叠色谱峰分离研究(英文)

作者：张晓星; 谢颜斌; 姚尧

来源：高电压技术, 2008, (12): 2708-2712.

• SF6 decomposed products
• overlapped chromatogram peaks
• iterative curve-fitting
• Gauss function
• GIS internal defects

The SF6 decomposed products are very alike,so the peaks of the SF6 decomposed products are overlapped.It make us hard to quantitatively calculate.This paper introduced a method to separate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function,and deduced the formula of the iterative curve-fitting;provided a method to calculate the initial value of the peaks intensity and width by iterative formula,and confirm the final peaks intensity and width to separate the overlapped signals.By the analysis of the real chromatogram data,it proved the validity of this method on the main components used in distinguishing the GIS internal defects.This method overcomes the influence of SF6 peak to the other thin concentration peaks,so it can be used in the study of the quantitative analysis of the decomposed products on different failures and different voltages.

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  输配电装备及系统安全与新技术国家重点实验室